"Simulation and experimental results of sub-aperture, transmitted wavefront measurements of a window using a time-delayed source," Proc. SPIE
Updated: Aug 12, 2014
Author(s): Matthew B. Dubin, William P. Kuhn
It is often desirable to measure an optical component whose aperture exceeds the capacity of the measurement device. However, stitching of sub-aperture measurement data into a single measurement of an optical component is a challenging problem since mechanical motions of the test component relative to the reference surface of an interferometer can not be made with interferometric accuracy. Even more challenging than the need to compensate for rigid body motion between the sub-aperture measurements is the need to account for imperfections in the reference surface itself. In this paper we show, both in simulation and experimentally, how the use of a time-delayed source (TDS) simplifies the stitching of transmitted wavefront measurements from domes and windows. This is accomplished by making it possible to obtain phase-shifted interferometric measurements using only the light reflected by two surfaces from a dome or window without the use of a reference surface.
Copyright 2007, Society of Photo-Optical Instrumentation Engineers (SPIE). This paper will be published in the SPIE Proceeding Window and Dome Technologies and Materials X (April 2007) and is made available as an electronic preprint with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
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